SEMPrep 2 (SC-2000)
SEM and EBSD sample preparation system
SEM and EBSD sample preparation system with Ion beam technology.
- Cross-sectional sample preparation by slope cutting in 90°, 45° and 30° by different sample holders.
- Final polishing and cleaning of traditional SEM and EBSD samples.
- Load-lock system for faster and easier sample exchange.
- High-energy ion gun for rapid milling.
- Optional ultra high-energy ion gun specially recommended for ion milling extra hard materials or for extreme fast milling.
- Low-energy ion gun for gentle surface polishing and cleaning.
- Automated parameter settings and operation.
- Sample rotation and oscillation.
- Real-time monitoring of the milling process by high-resolution CMOS camera and TFT monitor.
