X-Ray Diffraction (XRD)
The “powder X-Ray Diffraction” (XRPD) allows the crystalline structure deterination of the materials, the phase identification in a sample, and their weight quantification; studies on the aorphous content and the crystallinity degree.
Some other applications:
Thin film analysis and their thickness measurament by reflectometry in the field of semiconductors and optoelectronics
Stress and texture analysis in metal alloys
Kinetic and phase transformation studies with low and high temperature chambers
Microdiffration, until 10 micron spot, with very high brillance rotating anode generators