XRF-XRD Combined Instrument – Made by ASSING
Portable instrument (weighing less than two kilos) friendly user.
Fundamental in the field of Cultural Heritage, for non-destructive, non-invasive and non-contact surface analysis both for screening operations and for sample mapping.
Follows the chemical-structural characterization of artifacts and findings thanks to the combination of several analytical techniques.
Perform measurements in the field, with performances comparable to those of laboratory instruments, in an elementary range between 16S and 92U in air, and in a flow of He can also determine the elements from 15P to 11Na.
Apply the diffractometric analysis as a support to complete the chemical characterization for fluorescence X.
Uses a 3D technique: by the X tube for each angular step the whole energy spectrum is acquired, and then the classic two-dimensional "2Theta / Intensity" diffractogram is reconstructed (as if obtained from a single λ wavelength), integrating all the spectra obtained with the full range of λn wavelengths.
The Surface Monitor can be configured according to customer needs; it is possible to choose:
- A RAMAN spectrometer, to extend the characterization of the material
- A tube with the most appropriate anticathode to optimize the performance of the diffractometric system;
- With targets in Cu or Cr, to improve resolution and sensitivity in X diffraction, limiting the use of the spectrometer for qualitative or semi-quantitative elementary analysis.